Copper wire reactor/ Copper foil reactor 分為銅線式電抗、銅箔式電抗


	


	Good performance of suppression to high harmonic in electricity grid system 抑制電網中高次諧波


	Good performance of suppression to over currency and over voltage 限制合閘涌流及操作過電壓


	Improve power factor and curve of voltage 改善系統電壓波形，提高電網功率因數


	To help to arc extinguishing 有利于接觸器的滅弧


	To pretect system 保護設備正常運行


	To close temperature protector 常閉溫度保護器


	


	Rated voltage 額定電壓    單相250V、280V      三相440/ 480/ 525/  800VAC


	Voltage test 電壓測試      4K VAC/minute, T-C and T-T 端子對地、端子對端子加電壓4000VAC，麥提斯（北京）電力科技,.麥提斯（北京）電力科技|||Miltys電抗器材料,麥提斯（北京）電力科技有限公司，麥提斯（北京）電力科技,.麥提斯（北京）電力科技|||Miltys電抗器材料,麥提斯（北京）電力科技有限公司，持續一分鐘Temperature increasing 溫升    less than 120°C at rated frequency by insistence test 在持續測試冂下，在額定扌率下，溫度不**120度


	Insulation level 絕緣等級     H class (180°C)


	H class (180°C)      less than 48dB under normal working condition     小于48dBtest distance is 1 meter away from reactor 測試距離為一米


	Insulation paper used 絕緣紙    good inflaming retarding and dielectric property 良好的阻燃和介電性能紙


	Standard 標準        


	According to IEC 289 and GB/T 1094


	


	

1976年，Dr.Charles André Joseph Marie de Gaulle 參與了金屬化聚丙烯薄膜（Metallized PP films）的課題研究，并提出：平膜法在聚丙烯薄膜生產中的應用。
In 1976, Dr. Charles André Joseph Marie de Gaulle was engaged in the research on Metallized PP Films and proposed the application of the flat film method in the production of PP Films.
1988年，Dr.Charles André Joseph Marie de Gaulle 在美國的特拉華州，創建了MILTYS ELECTRIC INC公司，主要從事金屬化聚丙烯薄膜（Metallized PP films）的研發、實驗、生產。
In 1988, Dr. Charles André Joseph Marie de Gaulle established Miltys Electric INC in Delaware, America mainly engaged in the research, test and production of metallized PP films.
1999年，Dr.Charles André Joseph Marie de Gaulle設計了一種新型電容器用金屬化薄膜：漸變方阻式金屬化聚丙烯薄膜，使它能夠適應電容器較板電流密度的分布趨勢,達到電流密度近似均勻分布從而顯著提高抗電強度,解決了載流量與自愈性不能同時兼顧的難題。
In 1999, Dr.Charles André Joseph Marie de Gaulle designed a new metallized film for capacitor: Gradual Square Resistance Metallized PP Film, which can adapt to the distribution tendency of capacitor plate current density, and reach the approximate uniform distribution for current density to prominently improve dielectric withstanding voltage.